Small-sized X-ray diffractometers for structure and phase analysis purposes (review)

Nazarkin R.M.
UDC
539.262
DOI
10.18577/2307-6046-2019-0-9-89-99
Article PDF (Russian) (917.93 KB)
How to cite
Nazarkin R.M. Small-sized X-ray diffractometers for structure and phase analysis purposes (review) // Proceedings of VIAM. 2019. No. 9. DOI: 10.18577/2307-6046-2019-0-9-89-99. URL: https://test.viam.ru/en/journal/2019/9/10
Keywords
equipment, phase analysis, crystal lattice periods
Abstract

This review on the modern devices of a x-ray difraktometry which are available on commercial sale in the territory of the Russian Federation, is prepared for research scientists and engineering personnel, students and postgraduate students. The review will be useful to the experts conducting researches and development in the field of metallurgy, materials science, technology of materials, a crystallography and solid state physics. The principal schemes and methods of diffraction experiments are considered, the technical characteristics and exterior of desktop x-ray diffractometers are presented.

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