X-ray diffraction studies of electron beam ceramic thermal barrier coating layer based on ZrO2•Y2O3

Medvedev P.N., Muboyadzhyan S.A.
UDC
620.179:620.197
DOI
10.18577/2307-6046-2017-0-1-3-3
Article PDF (Russian) (768.57 KB)
How to cite
Medvedev P.N., Muboyadzhyan S.A. X-ray diffraction studies of electron beam ceramic thermal barrier coating layer based on ZrO2•Y2O3 // Proceedings of VIAM. 2017. No. 1. DOI: 10.18577/2307-6046-2017-0-1-3-3. URL: https://test.viam.ru/en/journal/2017/1/3
Keywords
crystallographic texture, XRD, thermal barrier coating, inverse pole figures.
Abstract

The structure of the ceramic thermal barrier coating layer deposited on the blade of nickel alloy has been evaluated in the paper. The structural aspect is a crystallographic texture and the estimation parameters are an axis and scattering texture. Methodological questions of obtaining this information from the x-ray diffraction spectrum have been observed. These characteristics allow determining the crystallographic growth direction of the coating columnar grains. The average deviation of the grain growth from normal to the surface is 10 degrees. The inverse pole figure analysis method for texture parameters quantifying has been developed in the work.

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