Polymer material research by х-ray photoelectronic spectroscopy

Article is of review and fact-finding character. Х-ray photoelectronic spectroscopy (XPS) scopes for polymeric material surface and interphase layer analysis are shown in the article. XPS is the unique research instrument of boundary layers in heterogeneous polymeric systems. Relevance of XPS application for developing polymeric composite materials of new generation is caused by the reason that properties and chemical structure of the interphase layer which is forming on border of the reinforcing filler and matrix define utilization properties of polymeric composite material. XPS is valuable method of research of the processes proceeding at surface modification of polymeric materials. Other important problem of XPS of polymeric materials is detecting of nanolayers of contaminating impurity on polymer surface which can influence on adhesive, electric, frictional, etc. properties.