Analysis of solders on tin and lead bases by X-ray floorescent spectroscopy
UDC
543.51; 669.1
DOI
10.18577/2307-6046-2021-0-4-124-131
Article PDF (Russian)
(701 KB)
How to cite
Alekseev A.V., Orlov G.V., Petrov P.S., Slavin A.V. Analysis of solders on tin and lead bases by X-ray floorescent spectroscopy // Proceedings of VIAM. 2021. No. 4. DOI: 10.18577/2307-6046-2021-0-4-124-131. URL: https://test.viam.ru/en/journal/2021/4/10
Keywords
x-ray fluorescence spectroscopy, x-ray fluorescence analysis, nickel alloys, solders, tin analysis, lead analysis.
Abstract
The determination of the elements Cu, Ni, Sb, Bi, Pb, Zn and Fe in the tin-based solder VPr35, as well as the elements Sn, Ni, Sb, Bi and In in the lead-based VPr40 solder by the method of х-ray fluorescence spectroscopy has been carried out. The calibration dependences are corrected taking into account the superposition of signals from interfering elements on the analytical signal and changes in intensity caused by inter-element influences in the matrix. The analysis was carried out by the method of fundamental parameters without using standard samples. The correctness of the results obtained was confirmed by their comparative analysis by atomic emission spectroscopy and high-resolution mass spectrometry with a glow discharge.
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