Microwave sample preparation of chrome for determination of contaminants by method of IСP-MS

Alekseev A.V., Yakimovitch P.V.
UDC
543.5:546.76
DOI
10.18577/2307-6046-2015-0-11-12-12
Article PDF (Russian) (678.23 KB)
How to cite
Alekseev A.V., Yakimovitch P.V. Microwave sample preparation of chrome for determination of contaminants by method of IСP-MS // Proceedings of VIAM. 2015. No. 11. DOI: 10.18577/2307-6046-2015-0-11-12-12. URL: https://test.viam.ru/en/journal/2015/11/12
Abstract

The technique of microwave sample preparation of chrome for determination of a mass fraction of Si, P, Fe, Cu, Zn, As, Sn, Sb, Pb and Bi by mass spectrometry with inductively coupled plasma method (IСP-MS) is described, and also test for content of these elements in a chrome sample is carried out. Compositions of mixes for dissolution, an order of addition of reagents and parameters of microwave decomposition are chosen. Spectral interferences are eliminated by means of reaction-collision cell application. The correctness of measurement techniques is verified by the «added–found» method. Range of the determination contents made 0,00001–0,18 mass %.

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