Silicium determination in nickel alloys by ICP-AES method in combination with micro-wave preparation

Karachevtsev F.N., Zagvozdkina T.N., Dvoretskov R.M.
UDC
543.42:661.68
DOI
10.18577/2307-6046-2015-0-12-7-7
Article PDF (Russian) (484.78 KB)
How to cite
Karachevtsev F.N., Zagvozdkina T.N., Dvoretskov R.M. Silicium determination in nickel alloys by ICP-AES method in combination with micro-wave preparation // Proceedings of VIAM. 2015. No. 12. DOI: 10.18577/2307-6046-2015-0-12-7-7. URL: https://test.viam.ru/en/journal/2015/12/7
Keywords
silicon, microwave digestion, nickel alloys, inductively coupled plasma atomic emission spectroscopy, measurement procedure.
Abstract

In various types of nickel alloys silicon is present in a wide concentration range from a few hundredths of a percent in the heat resisting nickel alloys to whole percent in the nickel-based solders. The paper describes a method of measuring the mass fraction of silicon in the nickel-based alloys by atomic emission spectrometry with inductively coupled plasma (ICP-AES) in combination with microwave sample preparation. Compositions of dissolution mixtures and parameters of microwave digestion were selected. Limits of relative measurement error for Si content from 0,01 to 8% don't exceed 2% (±δ, at P=0,95).

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